• DocumentCode
    123041
  • Title

    An analytical approach to system-level variation analysis and optimization for multi-core processor

  • Author

    Chenyun Pan ; Mukhopadhyay, Saibal ; Naeemi, Azad

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
  • fYear
    2014
  • fDate
    3-5 March 2014
  • Firstpage
    99
  • Lastpage
    106
  • Abstract
    In this paper, a variation-aware system-level design methodology is presented to analyze the throughput distribution under power, area and yield constraints at the early design stage of a multi-core processor. Based on compact system-level models and circuit-level Monte Carlo HSPICE simulations, the throughput distribution of a single core processor is obtained from an efficient top-down design approach that enables exploring a large multi-parameter design space spanning device-, circuit-, and system-level parameters. To reduce the impact of variations on a multi-core processor, disabling the slowest core and per-core clocking techniques are implemented and evaluated. Finally, a novel power reallocating technique that assigns more power to more power-efficient cores is proposed to further improve the yield and aggregate throughput of a multi-core processor.
  • Keywords
    Monte Carlo methods; circuit optimisation; integrated circuit design; multiprocessing systems; analytical approach; circuit-level Monte Carlo HSPICE simulations; large multiparameter design space spanning device; multicore processor; per-core clocking techniques; power reallocating technique; power-efficient cores; single core processor; system-level variation analysis; throughput distribution analysis; top-down design approach; variation-aware system-level design methodology; yield constraints; Clocks; Delays; Density measurement; Logic gates; Multicore processing; Power system measurements; Throughput; Process variation; methodology; multi-core; power reallocation; system-level analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality Electronic Design (ISQED), 2014 15th International Symposium on
  • Conference_Location
    Santa Clara, CA
  • Print_ISBN
    978-1-4799-3945-9
  • Type

    conf

  • DOI
    10.1109/ISQED.2014.6783312
  • Filename
    6783312