DocumentCode
123049
Title
Runtime fault recovery protocol for NoC-based MPSoCs
Author
Wachter, Eduardo ; Erichsen, Augusto ; Juracy, Leonardo ; Amory, Alexandre ; Moraes, Filipe
Author_Institution
Fac. of Inf., Santa Cruz do Sul Univ. (UNISC), Santa Cruz, Brazil
fYear
2014
fDate
3-5 March 2014
Firstpage
132
Lastpage
139
Abstract
The design of reliable MPSoCs is mandatory to cope with faults during fabrication or product lifetime. For instance, permanent faults on the interconnect network can stall or crash applications even though the network has alternative fault-free paths to a given destination. This paper presents a novel fault-tolerant communication protocol that takes advantage of the NoC parallelism to provide alternative paths between any source-target pair of processors, even in the presence of multiple faults. At the application layer, the method is seen as a typical MPI-like message passing protocol. At the lower layers, the method consists of a software kernel layer that monitors the regularity of message exchanges between pairs of tasks. If a message is not delivered in a certain time, the software fires a path finding mechanism implemented in hardware, which guarantees complete network reachability. The proposed approach determines new paths quickly, and the costs of extra silicon area and memory usage are small.
Keywords
fault tolerance; integrated circuit interconnections; microprocessor chips; network-on-chip; MPI-like message passing protocol; NoC-based MPSoC; application layer; fault-free paths; fault-tolerant communication protocol; interconnect network; memory usage; message exchanges; multiprocessor system-on-chip; network reachability; network-on-chip parallelism; path finding mechanism; permanent faults; product lifetime; runtime fault recovery protocol; software kernel layer; Fault tolerance; Fault tolerant systems; Hardware; Ports (Computers); Program processors; Protocols; Routing; NoC-based MPSoC; fault-tolerant communication protocol;
fLanguage
English
Publisher
ieee
Conference_Titel
Quality Electronic Design (ISQED), 2014 15th International Symposium on
Conference_Location
Santa Clara, CA
Print_ISBN
978-1-4799-3945-9
Type
conf
DOI
10.1109/ISQED.2014.6783316
Filename
6783316
Link To Document