Title :
Temperature-aware runtime power management for chip-multiprocessors with 3-D stacked cache
Author :
Kyungsu Kang ; De Micheli, G. ; Seunghan Lee ; Chong-Min Kyung
Author_Institution :
CAE Team, Samsung Electron., Hwasung, South Korea
Abstract :
The advent of 3-D fabrication technology makes it possible to stack a large amount of last-level cache memory onto a multi-core die to reduce off-chip memory accesses and, thus, increases system performance. However, the higher power density (i.e., power dissipation per unit volume) of 3-D integrated circuits (ICs) might incur temperature-related problems in reliability, leakage power, system performance, and cooling cost. In this paper, we propose a runtime solution to maximize the performance (i.e., instruction throughput) of chip-multiprocessors with 3-D stacked last-level cache memory, without thermal-constraint violation. The proposed method combines runtime cache tuning (e.g., cache-way partitioning, cache-way power-gating, cache data placement) with per-core dynamic voltage/frequency scaling (DVFS) in a temperature-aware manner. Experimental results show that the integrated method offers 23% performance improvement on average in terms of instructions per second (IPS) compared with temperature-aware runtime cache tuning only.
Keywords :
cache storage; integrated circuit reliability; microprocessor chips; multiprocessing systems; power aware computing; three-dimensional integrated circuits; 3D fabrication technology; 3D integrated circuits; 3D stacked last-level cache memory; DVFS; ICs; IPS; chip-multiprocessors; cooling cost; instructions per second; last-level cache memory; leakage power; multicore die; off-chip memory accesses; per-core dynamic voltage-frequency scaling; power density; reliability; system performance; temperature-aware runtime cache tuning; temperature-aware runtime power management; temperature-related problems; Clocks; Heat sinks; Memory management; Power demand; Runtime; Synchronization; Thermal resistance;
Conference_Titel :
Quality Electronic Design (ISQED), 2014 15th International Symposium on
Conference_Location :
Santa Clara, CA
Print_ISBN :
978-1-4799-3945-9
DOI :
10.1109/ISQED.2014.6783320