DocumentCode :
123068
Title :
Runtime 3-D stacked cache data management for energy minimization of 3-D chip-multiprocessors
Author :
Seunghan Lee ; Kyungsu Kang ; Jongpil Jung ; Chong-Min Kyung
fYear :
2014
fDate :
3-5 March 2014
Firstpage :
197
Lastpage :
204
Abstract :
In a 3-D processor-memory system, multiple cache dies can be stacked onto multi-core die to reduce latency and power of the on-chip wires connecting the cores and the cache, which finally increases the power efficiency. However, there are two challenging issues. The first is the high power density (resulting from multiple die stacking) that incurs many temperature-related problems including temperature-dependent leakage power. The second is the processor-cache traffic congestions that occur at through-silicon vias (TSVs) shared by multiple stacked caches. In this paper, a runtime cache data mapping is proposed for 3-D stacked L2 caches to minimize the overall energy of 3-D chip multiprocessors (CMPs). The proposed method considers both temperature distribution and memory traffic of 3-D CMPs. Experimental result shows that the proposed method achieves up to 22.88% energy reduction compared to an existing solution which considers only the temperature distribution.
Keywords :
cache storage; multiprocessing systems; temperature distribution; three-dimensional integrated circuits; 3D chip-multiprocessors; 3D processor-memory system; 3D stacked L2 caches; TSV; cache dies; die stacking; energy minimization; energy reduction; latency reduction; memory traffic; multicore die; multiple-stacked caches; on-chip wire power; power density; power efficiency; processor-cache traffic congestion; runtime 3D stacked cache data management; runtime cache data mapping; temperature distribution; temperature-dependent leakage power; temperature-related problem; through-silicon vias; Energy consumption; Instruction sets; Memory management; Multicore processing; Random access memory; Runtime; Temperature distribution;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quality Electronic Design (ISQED), 2014 15th International Symposium on
Conference_Location :
Santa Clara, CA
Print_ISBN :
978-1-4799-3945-9
Type :
conf
DOI :
10.1109/ISQED.2014.6783325
Filename :
6783325
Link To Document :
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