• DocumentCode
    123097
  • Title

    Optimal reliability-constrained overdrive frequency selection in multicore systems

  • Author

    Kahng, Andrew ; Nath, Siddhartha

  • Author_Institution
    CSE, Univ. of California at San Diego, La Jolla, CA, USA
  • fYear
    2014
  • fDate
    3-5 March 2014
  • Firstpage
    300
  • Lastpage
    308
  • Abstract
    In leading-edge process technologies, reliability is a first-class constraint for both IC design and system operation. For multicore systems, reliability affects task scheduling decisions since it constrains both performance and throughput. Previous works on reliability-constrained task scheduling have two basic limitations: either they cannot guarantee lifetime (e.g., that the chip can deliver useful performance over 10 years), or they cannot guarantee lower bounds on “acceptable performance” or “acceptable throughput” for the entire chip lifetime. In this work, we formulate and solve a new maximum-value, reliability-constrained overdrive frequencies (MVRCOF) problem that guarantees prescribed lower bounds on “acceptable performance” and “acceptable throughput” in multicore systems, without exceeding prescribed lifetime budget for any core. Our formulation maximizes value of overdrive frequencies for each number of active cores. We develop a solver for the MVRCOF problem and present optimal and heuristic solutions that determine the execution times of each core in each combination of simultaneously active cores, such that cores wear out in a balanced manner over the chip lifetime. These solutions deliver maximum value within the specified chip lifetime, and can be used for reliability-constrained scheduling policies. Our heuristic method can be 3.3% worse than our optimal method, but can converge up to 10× faster. Further, our solutions improve the objective function value by between 2.2% and 17.4% when compared to existing reliability-constrained task scheduling policies that provide lifetime guarantees.
  • Keywords
    integrated circuit design; integrated circuit reliability; microprocessor chips; multiprocessing systems; IC design; MVRCOF problem; acceptable performance; acceptable throughput; active cores; chip lifetime; first-class constraint; heuristic solutions; leading-edge process technologies; maximum-value reliability-constrained overdrive frequencies problem; multicore systems; optimal solutions; system operation; task scheduling decisions; Linear programming; Multicore processing; Reliability; Temperature; Temperature measurement; Throughput; Time-frequency analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality Electronic Design (ISQED), 2014 15th International Symposium on
  • Conference_Location
    Santa Clara, CA
  • Print_ISBN
    978-1-4799-3945-9
  • Type

    conf

  • DOI
    10.1109/ISQED.2014.6783340
  • Filename
    6783340