Title :
Development of generic testing strategies for mixed-signal integrated circuits
Author :
Pritchard, T.I. ; Evans, P.S.A. ; Taylor, D.
Author_Institution :
Sch. of Eng., Huddersfield Polytech., UK
fDate :
4/1/1992 12:00:00 AM
Abstract :
Describes work at the Polytechnic of Huddersfield SERC/DTI research project IED 2/1/2121 conducted in collaboration with GEC-Plessey Semiconductors, Wolfson Microelectronics, and UMIST. The aim of the work is to develop generic testing strategies for mixed-signal (mixed analogue and digital) integrated circuits. The paper proposes a test structure for mixed-signal ICs, and details the development of a test technique and fault model for the analogue circuit cells encountered in these devices. Results obtained during the evaluation of this technique in simulation are presented, and the ECAD facilities that have contributed to this and other such projects are described
Keywords :
application specific integrated circuits; circuit CAD; integrated circuit testing; ASICs; ECAD facilities; GEC-Plessey Semiconductors; Huddersfield Polytechnic; IED 2/1/2121; SERC/DTI research project; UMIST; Wolfson Microelectronics; analogue circuit cells; fault model; generic testing strategies; mixed analogue-digital ICs; mixed mode ICs; mixed-signal ICs; mixed-signal integrated circuits; test structure; test technique;
Journal_Title :
Circuits, Devices and Systems, IEE Proceedings G
