Development of generic testing strategies for mixed-signal integrated circuits

Author

Pritchard, T.I. ; Evans, P.S.A. ; Taylor, D.

Author_Institution

Sch. of Eng., Huddersfield Polytech., UK

Volume

139

Issue

2

fYear

1992

fDate

4/1/1992 12:00:00 AM

Firstpage

231

Lastpage

233

Abstract

Describes work at the Polytechnic of Huddersfield SERC/DTI research project IED 2/1/2121 conducted in collaboration with GEC-Plessey Semiconductors, Wolfson Microelectronics, and UMIST. The aim of the work is to develop generic testing strategies for mixed-signal (mixed analogue and digital) integrated circuits. The paper proposes a test structure for mixed-signal ICs, and details the development of a test technique and fault model for the analogue circuit cells encountered in these devices. Results obtained during the evaluation of this technique in simulation are presented, and the ECAD facilities that have contributed to this and other such projects are described

Keywords

application specific integrated circuits; circuit CAD; integrated circuit testing; ASICs; ECAD facilities; GEC-Plessey Semiconductors; Huddersfield Polytechnic; IED 2/1/2121; SERC/DTI research project; UMIST; Wolfson Microelectronics; analogue circuit cells; fault model; generic testing strategies; mixed analogue-digital ICs; mixed mode ICs; mixed-signal ICs; mixed-signal integrated circuits; test structure; test technique;

fLanguage

English

Journal_Title

Circuits, Devices and Systems, IEE Proceedings G

Publisher

iet

ISSN

0956-3768

Type

jour

Filename

139177