DocumentCode
1231281
Title
Testing a 4-b shift register at 11 GHz
Author
Yuh, P.-F.
Author_Institution
Hypres Inc., Elmsford, NY, USA
Volume
2
Issue
2
fYear
1992
fDate
6/1/1992 12:00:00 AM
Firstpage
101
Lastpage
105
Abstract
A 4-bit superconducting shift register based on edge triggered gates has been tested up to 11 GHz with two-phase offset sinewave clocks. The edge triggered gates are made by serial connection of a Josephson junction (JJ) and a modified variable threshold gate, fabricated by a Nb/AlO/sub x//Nb process.<>
Keywords
aluminium compounds; integrated circuit testing; logic testing; niobium; shift registers; superconducting logic circuits; 11 GHz; 4 bit; Josephson junction; MVTL; Nb-AlO/sub x/-Nb; edge triggered gates; modified variable threshold gate; serial connection; sinewave clocks; superconducting shift register; two phase clock; Clocks; Critical current; Electronics packaging; Josephson junctions; Logic gates; Niobium; Resistors; Shift registers; Switches; Testing;
fLanguage
English
Journal_Title
Applied Superconductivity, IEEE Transactions on
Publisher
ieee
ISSN
1051-8223
Type
jour
DOI
10.1109/77.139226
Filename
139226
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