Error rate measurements of a Josephson single flux quantum binary ripple counter

Author

Durand, D.J. ; Sandell, R.D. ; Heflinger, L. ; Silver, A.H.

Author_Institution

TRW Space & Technol. Group. Redondo Beach, CA, USA

Volume

2

Issue

2

fYear

1992

fDate

6/1/1992 12:00:00 AM

Firstpage

106

Lastpage

110

Abstract

Single-flux quantum devices are used in superconductive analog-to-digital converters (ADCs), shift registers, and memory cells. They have been proposed for logic applications. The authors report the performance of high-speed superconducting, single-flux quantum (SFQ) ripple counters. Both memory and logic functions of the counter are investigated. Errors in logic operation produce bit error rates (BERs) as low as 0.22 errors per million binary operations, measured while counting 100-MHz pseudorandom input pulses. Errors in memory function do not occur on the time scale of the measurements. The BER is shown to be nearly independent of input bit rate and pattern, but strongly dependent on the counter cell operating point.<>

Keywords

counting circuits; integrated circuit testing; logic testing; superconducting logic circuits; 100 MHz; 100 Mbit/s; BER; SFQ; binary ripple counter; bit error rates; counter cell operating point; input bit pattern; input bit rate; logic operation; memory function; pseudorandom input pulses; single flux quantum; Analog-digital conversion; Bit error rate; Counting circuits; Error analysis; Josephson junctions; Logic devices; Pulse measurements; Shift registers; Superconducting logic circuits; Superconductivity;

fLanguage

English

Journal_Title

Applied Superconductivity, IEEE Transactions on

Publisher

ieee

ISSN

1051-8223

Type

jour

DOI

10.1109/77.139227

Filename

139227