• DocumentCode
    123148
  • Title

    Post-silicon tunable clock buffer allocation based on fast chip yield computation

  • Author

    Hyungjung Seo ; Taewhan Kim

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Seoul Nat. Univ., Seoul, South Korea
  • fYear
    2014
  • fDate
    3-5 March 2014
  • Firstpage
    490
  • Lastpage
    495
  • Abstract
    As the process variation is dominating to cause the clock timing variation among chips to be much large, it is widely accepted that post-silicon tunable (PST) clock buffers can effectively resolve the the clock timing violation. Since PST buffers, which can reset the clock delay to flip-flops after the chip is manufactured, imposes a non-trivial implementation area and control circuitry, it is very important to minimally allocate PST buffers while satisfying the chip yield constraint. In this work, contrary to the previous PST buffer allocation algorithms, in which the chip yield computation is performed by the (very slow) Monte-Carlo simulation, obliged to have a limited design space exploration of PST allocation, we (1) develop a graph-based chip yield computation technique which can update yields very efficiently and accurately for incremental PST buffer allocation, based on which we (2) propose a systematic (bottom-up and top-down with refinement) PST buffer allocation algorithm that is able to fully explore the design space of PST buffer allocation. Experimental results through benchmark designs show that our proposed PST buffer allocation with fast chip yield computation uses 28.5%~90.1% less number of PST buffers than that by the previous works while achieving four orders of magnitude run time improvement with less than 3%~5% of yield accuracy error.
  • Keywords
    Monte Carlo methods; buffer circuits; clocks; flip-flops; graph theory; Monte-Carlo simulation; clock delay; clock timing variation; control circuitry; design space exploration; flip-flops; graph-based chip yield computation technique; incremental PST buffer allocation; magnitude run time improvement; nontrivial implementation area; post-silicon tunable clock buffer allocation; process variation; Bismuth; Clocks; Delays; Merging; Resource management; Space exploration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality Electronic Design (ISQED), 2014 15th International Symposium on
  • Conference_Location
    Santa Clara, CA
  • Print_ISBN
    978-1-4799-3945-9
  • Type

    conf

  • DOI
    10.1109/ISQED.2014.6783366
  • Filename
    6783366