DocumentCode
1231541
Title
Simplified Birthday Statistics and Hamming EDAC
Author
Tausch, Hans J.
Author_Institution
T2 Res., Albuquerque, NM
Volume
56
Issue
2
fYear
2009
fDate
4/1/2009 12:00:00 AM
Firstpage
474
Lastpage
478
Abstract
Space systems use error detection and correction (EDAC) schemes to protect memory contents from single event upsets (SEUs). Hamming EDAC is the preferred scheme for fast, random access memories. It allows for the correction of a single bit error within a word and the detection of a double bit error. The common assumption is that the likelihood of an uncorrectable double bit error is very small. This paper develops a simple equation that predicts the cumulative probability of a double bit error occurring within some word of Hamming protected memory as the number of random upsets increase and shows how it can be used to better understand the protection provided by EDAC.
Keywords
Hamming codes; error correction; error detection; probability; random processes; statistical analysis; Hamming EDAC; birthday statistics; bit error; cumulative probability; error correction; error detection; random access memories; Equations; Error correction; Error correction codes; Event detection; Protection; Radiation effects; Random access memory; Single event transient; Single event upset; Statistics; Error correction; Hamming codes; error detection coding; integrated circuit radiation effects; memory architecture; memory fault tolerance; radiation effects;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.2009.2012710
Filename
4812293
Link To Document