• DocumentCode
    1231541
  • Title

    Simplified Birthday Statistics and Hamming EDAC

  • Author

    Tausch, Hans J.

  • Author_Institution
    T2 Res., Albuquerque, NM
  • Volume
    56
  • Issue
    2
  • fYear
    2009
  • fDate
    4/1/2009 12:00:00 AM
  • Firstpage
    474
  • Lastpage
    478
  • Abstract
    Space systems use error detection and correction (EDAC) schemes to protect memory contents from single event upsets (SEUs). Hamming EDAC is the preferred scheme for fast, random access memories. It allows for the correction of a single bit error within a word and the detection of a double bit error. The common assumption is that the likelihood of an uncorrectable double bit error is very small. This paper develops a simple equation that predicts the cumulative probability of a double bit error occurring within some word of Hamming protected memory as the number of random upsets increase and shows how it can be used to better understand the protection provided by EDAC.
  • Keywords
    Hamming codes; error correction; error detection; probability; random processes; statistical analysis; Hamming EDAC; birthday statistics; bit error; cumulative probability; error correction; error detection; random access memories; Equations; Error correction; Error correction codes; Event detection; Protection; Radiation effects; Random access memory; Single event transient; Single event upset; Statistics; Error correction; Hamming codes; error detection coding; integrated circuit radiation effects; memory architecture; memory fault tolerance; radiation effects;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2009.2012710
  • Filename
    4812293