3D Active Edge Silicon Detector Tests With 120 GeV Muons

Author

Da Via, C. ; Deile, Mario ; Hasi, Jasmine ; Kenney, Christopher ; Kok, Angela ; Parker, Sherwood ; Watts, Stephen ; Anelli, Giovanni ; Avati, Valentina ; Bassetti, Valerio ; Boccone, Vittorio ; Bozzo, Marco ; Eggert, Karsten ; Ferro, Fabrizio ; Inyakin, A

Author_Institution

Phys. & Astron. Dept., Univ. of Manchester, Manchester

Volume

56

Issue

2

fYear

2009

fDate

4/1/2009 12:00:00 AM

Firstpage

505

Lastpage

518

Abstract

3D detectors with electrodes penetrating through the silicon wafer and covering the edges were tested in the SPS beam line X5 at CERN in autumn 2003. Detector parameters including efficiency, signal-to-noise ratio, and edge sensitivity were measured using a silicon telescope as a reference system. The measured sensitive width and the known silicon width were equal within less than 10 mum.

Keywords

electrodes; silicon radiation detectors; 3D active edge silicon detector tests; CERN; SPS beam line X5; electrodes; electron volt energy 120 GeV; signal-noise ratio; silicon telescope; silicon wafer; Detectors; Extraterrestrial measurements; Large Hadron Collider; Mesons; Optical scattering; Particle beams; Physics; Protons; Silicon; Testing; 3D silicon detectors; Roman pots; active edges; forward proton tagging; large hadron collider; radiation hardness;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/TNS.2009.2013951

Filename

4812298