DocumentCode :
1231778
Title :
The Measurement of Contact Difference in Potential on Certain Oxide-Coated Cathode Diodes
Author :
Levy, I.E.
Author_Institution :
Raytheon Manufacturing Co., Newton, Mass.
Volume :
38
Issue :
7
fYear :
1950
fDate :
7/1/1950 12:00:00 AM
Firstpage :
774
Lastpage :
776
Abstract :
Contact difference in potential for a conventional-type oxide-coated cathode diode is defined in terms of voltage required to establish zero field between the anode and cathode. Contact difference in potential has been found to be relatively unaffected by a wide fange of impurities added to the coating. Tests have shown that the Ectmeasurement is a sensitive technique for observing changes which take place on an initially clean anode.
Keywords :
Anodes; Cathodes; Coatings; Diodes; Impurities; Pulse circuits; Space charge; Space vector pulse width modulation; Testing; Voltage;
fLanguage :
English
Journal_Title :
Proceedings of the IRE
Publisher :
ieee
ISSN :
0096-8390
Type :
jour
DOI :
10.1109/JRPROC.1950.233436
Filename :
1701317
Link To Document :
بازگشت