Title :
A Double-Crystal X-Ray Goniometer for Accurate Orientation Determination
Author_Institution :
Bell Telephone Laboratories, Murray Hill, N.J.
Abstract :
An X-ray goniometer is turned into a double-crystal goniometer for use on precision cut AT quartz plates. Errors due to temperature change and to X-ray refraction are discussed. Precision of about one-tenth of a minute of arc is attained.
Keywords :
Bonding; Etching; Filters; Fluctuations; Goniometers; Instruments; Position measurement; Reflection; Senior members; Temperature;
Journal_Title :
Proceedings of the IRE
DOI :
10.1109/JRPROC.1950.234430
