DocumentCode :
12322
Title :
Component and System Level Studies of Radiation Damage Impact on Reflective Electroabsorption Modulators for Use in HL-LHC Data Transmission
Author :
Papadopoulos, Symeon ; El Nasr-Storey, Sarah Seif ; Troska, Jan ; Papakonstantinou, Ioannis ; Vasey, Francois ; Darwazeh, Izzat
Author_Institution :
PH Dept., CERN, Geneva, Switzerland
Volume :
60
Issue :
1
fYear :
2013
fDate :
Feb. 2013
Firstpage :
386
Lastpage :
393
Abstract :
We investigate the radiation hardness of Reflective Electroabsorption Modulators (REAMs) for fluence levels up to 14 ×1015 24 GeV p/cm2 to explore the possibility of utilising REAMs for data readout at the High-Luminosity Large Hadron Collider (HL-LHC). The high fluence levels used in the experiment and the online spectral measurements carried out provide significant insight into the radiation damage mechanism. The radiation limits of an architecture based on REAMs are established and compared to LHC and HL-LHC fluence levels.
Keywords :
data communication; electroabsorption; modulators; nuclear electronics; optical modulation; radiation hardening (electronics); readout electronics; semiconductor devices; HL-LHC data transmission; HL-LHC fluence levels; High-Luminosity Large Hadron Collider; REAM; data readout; high fluence levels; online spectral measurements; radiation damage impact; radiation damage mechanism; radiation hardness; radiation limits; reflective electroabsorption modulators; Absorption; Current measurement; Leakage current; Modulation; Radiation effects; Temperature measurement; Voltage measurement; Optical links; optoelectronic devices; radiation effects;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.2012.2231964
Filename :
6412753
Link To Document :
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