• DocumentCode
    123224
  • Title

    Topology optimization of a passive thermal actuator

  • Author

    Steiner, H. ; Hortschitz, Wilfried ; Keplinger, F. ; Sauter, T.

  • Author_Institution
    Center for Integrated Sensor Syst., Danube Univ. Krems, Wiener Neustadt, Austria
  • fYear
    2014
  • fDate
    3-5 March 2014
  • Firstpage
    743
  • Lastpage
    747
  • Abstract
    This paper presents a topology-optimized passive thermal micro actuator with large thermal deflection. The actuator relies on different coefficients of thermal expansion of an active material as well as the substrate and temperature changes of the surrounding environment. COMSOL Multiphysics is used for the topology optimization algorithm. The resulting shape is approximated by straight beams for a simpler fabrication. Two such shapes are arranged facing each other and coupled to a lever beam for a further increase of the temperature dependent deflection. The final design is manufactured using electroplated Ni on a Si substrate and state-of-the-art micro fabrication processes. The structures are characterized in a temperature range from -30°C up to +40°C with a measurement setup comprising a sealable chamber, a thermoelectric stage, and an optical microscope. The actuator exhibits a measured linear temperature deflection of 1 μm/K and a simulated force of 9.5 μN/K. The occupied area is 1.7×2.4 mm2 while the area-specific work is 2.34 μJ/K2/m2.
  • Keywords
    microactuators; microfabrication; nickel; thermal expansion; COMSOL Multiphysics; Ni; active material; coefficients of thermal expansion; electroplated nickel; lever beam; measured linear temperature deflection; microfabrication processes; optical microscope; sealable chamber; temperature dependent deflection; thermoelectric stage; topology-optimized passive thermal microactuator; Actuators; Force; Nickel; Optimization; Stress; Temperature measurement; Topology; Galvanic Nickel; Passive; Thermal Micro Actuator; Topology Optimization;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality Electronic Design (ISQED), 2014 15th International Symposium on
  • Conference_Location
    Santa Clara, CA
  • Print_ISBN
    978-1-4799-3945-9
  • Type

    conf

  • DOI
    10.1109/ISQED.2014.6783401
  • Filename
    6783401