Title :
Reflectometry by means of optical-coherence modulation
Author :
Hotate, Kazuo ; Kamatani, O.
Author_Institution :
Res. Center for Adv. Sci. & Technol., Tokyo Univ., Japan
Abstract :
Novel reflectometry with millimetre or submillimetre spatial resolution is proposed to evaluate optical components or circuits. The optical coherence is modulated to have a periodic delta-function shape along the optical path, and the backscattering intensity is obtained directly. The experiment demonstrates a resolution of about 10 mm in air with a Fabry-Perot laser diode.
Keywords :
backscatter; optical modulation; optical testing; reflectometry; Fabry-Perot laser diode; MM-wave spatial resolution; backscattering intensity; optical circuits evaluation; optical component testing; optical components; optical-coherence modulation; periodic delta-function shape; reflectometry; submillimetre spatial resolution;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19891009
