• DocumentCode
    1233017
  • Title

    An examination of variability and its basic properties for a factory

  • Author

    Wu, Kan

  • Author_Institution
    IE Dept., Inotera Memories Inc., Taoyuan, Taiwan
  • Volume
    18
  • Issue
    1
  • fYear
    2005
  • Firstpage
    214
  • Lastpage
    221
  • Abstract
    Variability is a key performance index of a factory. In order to characterize variability of a factory, definitions of bottleneck, utilization, and variability of a single machine are reexamined and clarified. The clarification leads to the introduction of a detail expression for the relationship between cycle time and work-in-progress. In order to quantify variability for factories, the author uses a single machine system to gauge the behaviors, and subsequently derives an explicit expression for the variability, of a simple factory, making use of analogy and the clarified definitions. The obtained results can be applied to many subjects in the field of manufacturing management, such as factory performance analysis, capacity planning, and cycle time reduction. With the derived results, properties of variability for a simple factory in the aspects of utilization versus throughput bottlenecks and nonthroughput bottlenecks, gap effects, and bounds on variability, are examined in detail to shed light on the insights of the stochastic behaviors of a complex factory.
  • Keywords
    electronics industry; equipment evaluation; production equipment; production facilities; semiconductor device manufacture; analogy; capacity planning; cycle time reduction; equipment evaluation; factory performance analysis; factory performance index; machine system; machine utilization; manufacturing management; process bottlenecks; production equipment; single machine variability; stochastic behaviors; Capacity planning; Investments; Performance analysis; Production equipment; Production facilities; Production management; Productivity; Semiconductor device manufacture; Stochastic processes; Throughput;
  • fLanguage
    English
  • Journal_Title
    Semiconductor Manufacturing, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0894-6507
  • Type

    jour

  • DOI
    10.1109/TSM.2004.840525
  • Filename
    1393062