• DocumentCode
    1233055
  • Title

    Temperature dependence of optical gain, quantum efficiency, and threshold current in GaAs/GaAlAs graded-index separate-confinement heterostructure single-quantum-well lasers

  • Author

    Zhu, L.D. ; Zheng, B.Z. ; Feak, G.A.B.

  • Author_Institution
    Inst. of Semicond., Chinese Acad. of Sci., Beijing, China
  • Volume
    25
  • Issue
    9
  • fYear
    1989
  • fDate
    9/1/1989 12:00:00 AM
  • Firstpage
    2007
  • Lastpage
    2012
  • Abstract
    The temperature dependence of the optical gain in graded-index separate-confinement heterostructure single-quantum-well lasers with different quantum-well widths were investigated. The observed dependence of the kink temperature on cavity loss and quantum-well width and the differential quantum efficiency minimum at the kink temperature were analyzed in terms of the temperature variation of the gain spectra and peak gain curves. Dependences of the characteristic temperature T 0 on the quantum-well width, cavity loss, and temperature range are discussed in terms of the variation of the peak modal gain versus current relation with temperature and quantum-well width
  • Keywords
    III-V semiconductors; aluminium compounds; gallium arsenide; laser cavity resonators; semiconductor junction lasers; semiconductor quantum wells; GaAs-GaAlAs; GaAs/GaAlAs graded-index separate-confinement heterostructure single-quantum-well lasers; III-V semiconductor; cavity loss; current; differential quantum efficiency minimum; gain spectra; kink temperature; laser cavity resonators; optical gain temperature dependence; peak gain curves; peak modal gain; quantum efficiency; quantum-well widths; temperature range; threshold current; Gallium arsenide; Optical losses; Optical scattering; Optical sensors; Quantum well lasers; Quantum wells; Semiconductor lasers; Temperature dependence; Temperature distribution; Temperature sensors; Threshold current;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/3.35226
  • Filename
    35226