DocumentCode
1233109
Title
Energy-efficiency bounds for deep submicron VLSI systems in the presence of noise
Author
Wang, Lei ; Shanbhag, Naresh R.
Author_Institution
Microprocessor Technol. Labs., Hewlett-Packard Co., Fort Collins, CO, USA
Volume
11
Issue
2
fYear
2003
fDate
4/1/2003 12:00:00 AM
Firstpage
254
Lastpage
269
Abstract
In this paper, we present an algorithm for computing the bounds on energy-efficiency of digital very large scale integration (VLSI) systems in the presence of deep submicron noise. The proposed algorithm is based on a soft-decision channel model of noisy VLSI systems and employs information-theoretic arguments. Bounds on energy-efficiency are computed for multimodule systems, static gates, dynamic circuits and noise-tolerant dynamic circuits in 0.25-/spl mu/m CMOS technology. As the complexity of the proposed algorithm grows linearly with the size of the system, it is suitable for computing the bounds on energy-efficiency for complex VLSI systems. A key result presented is that noise-tolerant dynamic circuits offer the best trade off between energy-efficiency and noise-immunity when compared to static and domino circuits. Furthermore, employing a 16-bit noise-tolerant Manchester adder in a CDMA receiver, we demonstrate a 31.2%-51.4% energy reduction over conventional systems when operating in the presence of noise. In addition, we compute the lower bounds on energy dissipation for this CDMA receiver and show that these lower bounds are 2.8/spl times/ below the actual energy consumed, and that noise-tolerance reduces the gap between the lower bounds and actual energy dissipation by a factor of 1.9/spl times/.
Keywords
CMOS digital integrated circuits; VLSI; adders; circuit analysis computing; code division multiple access; digital arithmetic; integrated circuit modelling; integrated circuit noise; low-power electronics; receivers; 0.25 micron; 16 bit; CDMA receiver; CMOS technology; deep submicron VLSI systems; deep submicron noise; digital VLSI systems; energy-efficiency bounds; low power; multimodule systems; noise-immunity; noise-tolerant Manchester adder; noise-tolerant dynamic circuits; noisy VLSI systems; soft-decision channel model; static gates; CMOS technology; Circuit noise; Crosstalk; Energy dissipation; Energy efficiency; Multiaccess communication; Noise reduction; Semiconductor device noise; Signal to noise ratio; Very large scale integration;
fLanguage
English
Journal_Title
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher
ieee
ISSN
1063-8210
Type
jour
DOI
10.1109/TVLSI.2003.810783
Filename
1210505
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