Title :
Velocity modulation in III/V-HBTs
Author :
Rohner, M. ; Willén, Bo ; Jäckel, Heinz
Author_Institution :
Leica Geosystems AG, Heerbrugg, Switzerland
fDate :
5/1/2003 12:00:00 AM
Abstract :
Velocity modulation is shown to have a strong impact on the base/collector capacitance and the collector transit-time delay which dominate the high-speed performance of state-of-the-art HBTs. The authors present a theoretical analysis of the velocity modulation effects, which is the basis of a method to assess their strength from measured S-parameters. Monte Carlo simulations are in good agreement with the measurements, providing strong support for the theory. As a consequence, the authors find that the carrier velocity is much lower than estimated from transit-time measurements when neglecting velocity modulation and that base-pushout occurs at much lower current levels than commonly expected.
Keywords :
III-V semiconductors; Monte Carlo methods; S-parameters; capacitance; delays; heterojunction bipolar transistors; modulation; semiconductor device models; III/V-HBTs; InP; Monte Carlo simulations; S-parameters; base-pushout; base/collector capacitance; carrier velocity; collector transit-time delay; high-speed performance; transit-time measurements; velocity modulation effects; Capacitance; Cause effect analysis; Charge carrier processes; Charge measurement; Current measurement; Delay estimation; Doping; Electrons; Velocity measurement; Voltage;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/TED.2003.813466