DocumentCode :
1233842
Title :
Operation Limits for RTD-Based MOBILE Circuits
Author :
Quintana, José M. ; Avedillo, María J. ; Nunez, Juan ; Roldán, Héctor Pettenghi
Author_Institution :
Dept. of Electron. & Electromagn., Univ. of Seville, Seville
Volume :
56
Issue :
2
fYear :
2009
Firstpage :
350
Lastpage :
363
Abstract :
Resonant-tunneling-diode (RTD)-based monostable-bistable logic element (MOBILE) circuits operate properly in a certain frequency range. They exhibit both a minimum operating frequency and a maximum one. From a design point of view, it should be desirable to have gates with a correct operation from dc up to the maximum operating frequency (i.e., without the minimum bound). This paper undertakes this problem by analyzing how transistors and RTDs interact in RTD-based circuits. Two malfunctions have been identified: the incorrect evaluation of inputs and the lack of self-latching operation. The difficulty to study these problems in an analytical way has been overcome by resorting to series expansions for both the RTD and the heterojunction field-effect transistor I-V characteristics in the points of interest. We have obtained analytical expression linking representative device parameters and technological setup, for a MOBILE-based circuit to operate correctly.
Keywords :
high electron mobility transistors; logic circuits; resonant tunnelling diodes; threshold elements; RTD-based MOBILE circuits; heterojunction field-effect transistor; linear threshold gates; monostable-bistable logic element circuits; resonant-tunneling-diode; Linear Threshold Gates; Linear threshold gates (LTGs); MOBILE circuits; MOnostable–BIstable Logic Element (MOBILE) circuits; Nanoelectronics; Resonant Tunneling Diodes (RTDs); nanoelectronics; resonant tunneling diodes (RTDs);
fLanguage :
English
Journal_Title :
Circuits and Systems I: Regular Papers, IEEE Transactions on
Publisher :
ieee
ISSN :
1549-8328
Type :
jour
DOI :
10.1109/TCSI.2008.925943
Filename :
4530862
Link To Document :
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