DocumentCode :
1233983
Title :
Well-behaved global on-chip interconnect
Author :
Caputa, Peter ; Svensson, Christer
Author_Institution :
Dept. of Electr. Eng., Linkoping Univ., Sweden
Volume :
52
Issue :
2
fYear :
2005
Firstpage :
318
Lastpage :
323
Abstract :
Global interconnects have been identified as a serious limitation to chip scaling, due to their latency and power consumption. We demonstrate a scheme to overcome these limitations, based on the utilization of upper-level metals, combined with structured communication architecture. Microwave style transmission lines in upper-level metals allow close-to-velocity-of-light delays if properly dimensioned. As an example, we demonstrate a 480-μm-wide and 20-mm-long bus with a capacity of 320 Gb/s in a nearly standard 0.18-μm process. The process differs from a standard process only through a somewhat thicker outer metal layer. We further illustrate how "self pre-emphasis" at the launch of a data pulse can be used to double the maximum available data rate over a wire. The proposed techniques are scalable, given that higher level metals are properly dimensioned in future processes.
Keywords :
chip scale packaging; delays; integrated circuit design; integrated circuit interconnections; integrated circuit metallisation; 0.18 micron; chip scaling; communication architecture; data pulse; global interconnect; interconnect delay; on chip bus; power consumption; transmission lines; upper level metals; Delay; Impedance; Inductance; Integrated circuit interconnections; Intersymbol interference; Propagation losses; Skin effect; Transfer functions; Transmission line theory; Wire; Interconnect; global interconnect; interconnect delay; on-chip bus; upper-level metal;
fLanguage :
English
Journal_Title :
Circuits and Systems I: Regular Papers, IEEE Transactions on
Publisher :
ieee
ISSN :
1549-8328
Type :
jour
DOI :
10.1109/TCSI.2004.840483
Filename :
1393164
Link To Document :
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