DocumentCode :
1234327
Title :
3.9 ps SiGe HBT ECL ring oscillator and transistor design for minimum gate delay
Author :
Jagannathan, Basanth ; Meghelli, Mounir ; Chan, Kevin ; Rieh, Jae-Sung ; Schonenberg, Kathryn ; Ahlgren, David ; Subbanna, Seshadri ; Freeman, Greg
Author_Institution :
IBM Microelectron. Semicond. R&D Center, Hopewell Junction, NY, USA
Volume :
24
Issue :
5
fYear :
2003
fDate :
5/1/2003 12:00:00 AM
Firstpage :
324
Lastpage :
326
Abstract :
We show empirical results that demonstrate the effect of high performance SiGe HBT design parameters on the minimum gate delay of an ECL ring oscillator. SiGe HBT devices with a high f/sub MAX/ (338 GHz) and a low f/sub T/ (180 GHz) achieve a minimum delay of 3.9 ps, which to our knowledge is the lowest reported delay for a silicon based logic gate. Compared to the extracted (extrapolated) f/sub T/ and f/sub MAX/, a simple figure of merit proportional to /spl radic/f/sub T//R/sub B/C/sub CB/ with R/sub B/ and C/sub CB/ extracted from S-parameter measurement is best correlated to the minimum gate delay.
Keywords :
Ge-Si alloys; bipolar logic circuits; delays; emitter-coupled logic; heterojunction bipolar transistors; high-speed integrated circuits; logic gates; oscillators; semiconductor materials; 180 GHz; 3.9 ps; 338 GHz; Si based logic gate; SiGe; SiGe HBT ECL ring oscillator; SiGe HBT design parameters; high-speed devices; minimum gate delay; Circuits; Delay effects; Germanium silicon alloys; Heterojunction bipolar transistors; Logic devices; Logic gates; Ring oscillators; Silicon germanium; Space technology; Temperature;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/LED.2003.812568
Filename :
1210841
Link To Document :
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