• DocumentCode
    1234788
  • Title

    Scattering parameter transient analysis of transmission lines loaded with nonlinear terminations

  • Author

    Schutt-Aine, Jose E. ; Mittra, Raj

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Illinois Univ., Urbana, IL, USA
  • Volume
    36
  • Issue
    3
  • fYear
    1988
  • fDate
    3/1/1988 12:00:00 AM
  • Firstpage
    529
  • Lastpage
    536
  • Abstract
    An approach for the time-domain simulation of transients on a dispersive and lossy transmission line terminated with active devices is presented. The method combines the scattering matrix of an arbitrary line and the nonlinear causal impedance functions at the loads to derive expressions for the signals at the near and far ends. The problems of line losses, dispersion, and nonlinearities are first investigated. A time-domain formulation is then proposed using the scattering-matrix representation. The algorithm assumes that dispersion and loss models for the transmission lines are available and that the frequency dependence is known. Large-signal equivalent circuits for the terminations are assumed to be given. Experimental and computer-simulated results are compared for the lossless dispersionless case, and the effects of losses and dispersion are predicted
  • Keywords
    S-matrix theory; S-parameters; equivalent circuits; impedance matching; time-domain analysis; transmission line theory; dispersion models; large signal equivalent circuits; line losses; loss models; microstrip lines; nonlinear causal impedance functions; nonlinear terminations; scattering matrix; scattering parameter transient analysis; time-domain formulation; time-domain simulation; transmission lines; Dispersion; Distributed parameter circuits; Impedance; Power system transients; Propagation losses; Scattering parameters; Time domain analysis; Transient analysis; Transmission line matrix methods; Transmission lines;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.3545
  • Filename
    3545