• DocumentCode
    12348
  • Title

    Analytical S -Parameter Sensitivity Formula for the Shape Parameters of Dielectric Objects

  • Author

    Dadash, M. Sadegh ; Nikolova, Natalia K.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., McMaster Univ., Hamilton, ON, Canada
  • Volume
    24
  • Issue
    5
  • fYear
    2014
  • fDate
    May-14
  • Firstpage
    291
  • Lastpage
    293
  • Abstract
    An exact sensitivity expression is proposed for the computation of S-parameter derivatives with respect to the shape parameters of isotropic dielectric objects. While an exact expression has already been developed for the shape parameters of volumetric metallic objects, to our knowledge, the case of dielectric objects has only been treated with approximations. The proposed expression integrates the field solution on the surfaces of the objects of interest. This solution is already available from the simulation computing the S-parameters. Therefore, it features negligible computational overhead compared with the full-wave simulation. At the same time, it provides the best accuracy for the given numerical field solution. It is validated through the sensitivity analysis of microwave structures simulated by a commercial electromagnetic solver based on the finite-element method.
  • Keywords
    S-parameters; dielectric materials; electromagnetic waves; finite element analysis; S-parameter derivatives; S-parameter sensitivity formula; computational overhead; electromagnetic solver; finite element method; full-wave simulation; isotropic dielectric objects; microwave structures; sensitivity analysis; shape parameters; simulation computing; volumetric metallic objects; Dielectrics; Microwave theory and techniques; Permittivity; Ports (Computers); Sensitivity analysis; Shape; Adjoint-variable method; computer-aided design (CAD); electromagnetic analysis; response Jacobians; sensitivity analysis;
  • fLanguage
    English
  • Journal_Title
    Microwave and Wireless Components Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1531-1309
  • Type

    jour

  • DOI
    10.1109/LMWC.2014.2306891
  • Filename
    6750129