Title :
Discarding wide baseline mismatches via topological clustering
Author :
Wang, Y.T. ; Zhang, D.Z. ; Tian, J.-W.
Author_Institution :
IPRAI of OUST State Key Lab. for Multi- spectral Inf. Process. Technol., Huazhong Univ. of Sci. & Technol., Wuhan
Abstract :
A novel scheme called topological clustering is presented to discard SIFT mismatches, based on the topological relationship consistence between two SIFT matches. The experimental results show that the developed method can extract high correct ratio matches efficiently from low correct ratio initial matches for wide baseline image pairs.
Keywords :
image matching; pattern clustering; transforms; SIFT mismatch; baseline mismatches; scale invariant feature transform; topological clustering; wide baseline image pairs;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:20083624
