• DocumentCode
    1235009
  • Title

    Discarding wide baseline mismatches via topological clustering

  • Author

    Wang, Y.T. ; Zhang, D.Z. ; Tian, J.-W.

  • Author_Institution
    IPRAI of OUST State Key Lab. for Multi- spectral Inf. Process. Technol., Huazhong Univ. of Sci. & Technol., Wuhan
  • Volume
    44
  • Issue
    11
  • fYear
    2008
  • Firstpage
    670
  • Lastpage
    671
  • Abstract
    A novel scheme called topological clustering is presented to discard SIFT mismatches, based on the topological relationship consistence between two SIFT matches. The experimental results show that the developed method can extract high correct ratio matches efficiently from low correct ratio initial matches for wide baseline image pairs.
  • Keywords
    image matching; pattern clustering; transforms; SIFT mismatch; baseline mismatches; scale invariant feature transform; topological clustering; wide baseline image pairs;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:20083624
  • Filename
    4531509
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1235009