DC measurement errors due to auto-zeroed amplifier noise

Author

Trofimenkoff, F.N. ; Finvers, I.G. ; Haslett, J.W.

Author_Institution

Dept. of Electr. & Comput. Eng., Calgary Univ., Alta., Canada

Volume

45

Issue

1

fYear

1996

fDate

2/1/1996 12:00:00 AM

Firstpage

317

Lastpage

318

Abstract

An empirical fit to the noise voltage source spectrum of an auto-zeroed operational amplifier is used to calculate the variance in the measurement of the amplifier´s dc input voltage or its input offset voltage. Convenient closed-form solutions for the variance and hence the normalized standard error are obtained. This allows the selection of the integration time required to achieve a desired accuracy in the measurement of the dc voltage if the low-frequency noise plateau is known or to measure the low-frequency noise plateau using a simple circuit and dc voltage measurements

Keywords

electric noise measurement; electron device noise; measurement errors; operational amplifiers; signal processing equipment; voltage measurement; DC measurement errors; auto-zeroed amplifier noise; auto-zeroed operational amplifier; closed-form solutions; dc input voltage; empirical fit; input offset voltage; integration time; low-frequency noise; noise voltage source spectrum; normalized standard error; variance; Frequency; Integrated circuit measurements; Low-frequency noise; Low-noise amplifiers; Measurement errors; Noise level; Noise measurement; Operational amplifiers; Time measurement; Voltage;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/19.481358

Filename

481358