Using Insulation Resistance as a Dew Point Transducer for Process Control

Moisture control is recognized to be an exceedingly important process control variable, especially when compared to advances in measurement and control of other process variables. This paper explores the range of instrumentation techniques available and focuses particular attention on a conductivity technique employed in measuring dew point temperatures. A background of investigative efforts in moisture film formation is given and the development of a dew temperature transducer from this basic work is described. A general survey of present applications is presented, as well as a discussion of possible future applications.