DocumentCode :
1235312
Title :
Microwave inductors and capacitors in standard multilevel interconnect silicon technology
Author :
Burghartz, Joachim N. ; Soyuer, Mehmet ; Jenkins, Keith A.
Author_Institution :
Res. Div., IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
Volume :
44
Issue :
1
fYear :
1996
fDate :
1/1/1996 12:00:00 AM
Firstpage :
100
Lastpage :
104
Abstract :
Spiral inductors and metal-to-metal capacitors for microwave applications, which are integrated on a silicon substrate by using standard 0.8 μm BiCMOS technology, are described. Optimization of the inductors has been achieved by tailoring the vertical and lateral dimensions and by shunting several interconnect metal layers together. Lumped element models of inductors and capacitors provide detailed understanding of the important geometry and technological parameters on the device characteristics. The high quality factors of nearly 10 for the inductors are among the best results in silicon, particularly when using standard silicon technology
Keywords :
BiCMOS integrated circuits; MIM devices; MMIC; Q-factor; elemental semiconductors; equivalent circuits; inductors; integrated circuit interconnections; integrated circuit metallisation; silicon; thin film capacitors; 0.8 micron; BiCMOS technology; MIM capacitors; Si; Si substrate; device characteristics; interconnect metal layers shunting; lumped element models; metal-to-metal capacitors; microwave capacitors; microwave inductors; multilevel interconnect Si technology; spiral inductors; standard Si technology; BiCMOS integrated circuits; Capacitors; Conductivity; Gallium arsenide; Inductors; Integrated circuit interconnections; Integrated circuit technology; Microwave technology; Silicon on insulator technology; Spirals;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/22.481391
Filename :
481391
Link To Document :
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