Title :
A New Technique for the Characterization of Cesium Beam Tube Performance
Author :
Hurrell, John P. ; Johnson, Walter A. ; Karuza, Sarunas K. ; Voit, Frank J.
Keywords :
Atomic measurements; Clocks; Current measurement; Degradation; Electron multipliers; Electron tubes; Gain measurement; Noise figure; Performance gain; Signal to noise ratio;
Journal_Title :
Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
DOI :
10.1109/T-UFFC.1987.26990
