Title :
Locking and Noise in a Model of a Negative-Resistance Oscillator
Author :
Gambling, W.Alec ; Kitching, David M. ; Welch, Robert S.
Abstract :
Measurements of the locking voltage and frequency range for a simple negative-resistance oscillator are shown to be in excellent agreement with a theory which assumes a van der Pol nonlinearity. When the noise generated in the nonlinear element is taken into account, the measurements of output noise produced by a noise driving current are also in agreement with theory.
Keywords :
Capacitance measurement; Circuit noise; Current measurement; Frequency measurement; Noise generators; Noise measurement; RLC circuits; Resistors; Voltage; Voltage-controlled oscillators;
Journal_Title :
Education, IEEE Transactions on
DOI :
10.1109/TE.1967.4320300
