Schwarz-Christoffel transformation for the simulation of two-dimensional capacitance [VLSI circuits]

Author

Koç, Ç K. ; Ordung, P.F.

Author_Institution

Dept. of Electr. Eng., Houston Univ., TX, USA

Volume

8

Issue

9

fYear

1989

fDate

9/1/1989 12:00:00 AM

Firstpage

1025

Lastpage

1027

Abstract

An inherent problem in the use of simulators for the determination of capacitance in VLSI circuits is the verification of the reliability of the simulation. The problem is due to the numerical approximations made in order to achieve a versatile simulation. The Schwarz-Christoffel transformation provides theoretically exact simulation of a limited class of problems consisting of two odd shaped conductors embedded in a uniform dielectric. It is proposed that the Schwarz-Christoffel technique can be used to calibrate simulators designed for more general problems

Keywords

VLSI; capacitance; digital simulation; electronic engineering computing; Schwarz-Christoffel transformation; VLSI circuits; embedded conductors; simulation; simulator calibration; two-dimensional capacitance; uniform dielectric; Benchmark testing; Built-in self-test; CMOS logic circuits; Circuit faults; Circuit simulation; Computational modeling; Logic design; Parasitic capacitance; Programmable logic arrays; Very large scale integration;

fLanguage

English

Journal_Title

Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on

Publisher

ieee

ISSN

0278-0070

Type

jour

DOI

10.1109/43.35556

Filename

35556