• DocumentCode
    1235591
  • Title

    Discussion on application of the Weibull distribution to electrical breakdown of insulating materials

  • Author

    Fabiani, Davide ; Simoni, Luciano

  • Author_Institution
    Dipt. di Ingegneria elettrica, Bologna Univ.
  • Volume
    12
  • Issue
    1
  • fYear
    2005
  • Firstpage
    11
  • Lastpage
    16
  • Abstract
    The Weibull distribution is commonly used for statistical processing of breakdown data of electrical insulation. The statistical theory of breakdown that has been proposed since the 1970s has introduced a two-variables Weibull distribution in order to take into account both the stress applied and the failure times. In this paper this distribution is thoroughly discussed and then rejected. Indeed, the random variable is only one; the other is an independent variable that becomes random only through the first, with the same shape parameter. The case of breakdown after electrical or multiple-stress aging (electric strength test on aged specimens) is also examined and the probability distribution function is written even in the general case, where the probability is a function of several variables. Only one of the latter, i.e. the electric strength ES, is the random variable while the others, such as the applied stresses and the time at which the ES measurement is performed, are independent
  • Keywords
    Weibull distribution; ageing; electric breakdown; electric field measurement; electric strength; insulating materials; materials testing; stress analysis; ES measurement; Weibull distribution; electrical breakdown; electrical insulation; failure analysis; insulating material; multiple-stress aging; probability distribution function; random variable; same shape parameter; statistical processing; Aging; Dielectrics and electrical insulation; Electric breakdown; Electric variables measurement; Probability distribution; Random variables; Shape; Stress; Testing; Weibull distribution;
  • fLanguage
    English
  • Journal_Title
    Dielectrics and Electrical Insulation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1070-9878
  • Type

    jour

  • DOI
    10.1109/TDEI.2005.1394010
  • Filename
    1394010