DocumentCode :
1236216
Title :
Nb/Al/Nb junctions with a wide range of characteristic voltages for superconducting electronic applications
Author :
Lacquaniti, Vincenzo ; Maggi, Sabino ; Steni, Raffaella ; Cagliero, Chiara ; Andreone, Domenico ; Rocci, Roberto
Author_Institution :
Inst. Elettrotecnico Nazionale "Galileo Ferraris", Turin, Italy
Volume :
13
Issue :
2
fYear :
2003
fDate :
6/1/2003 12:00:00 AM
Firstpage :
146
Lastpage :
149
Abstract :
Josephson devices for superconducting electronic applications, such as RSFQ logic circuits and programmable voltage standards, require nonhysteretic junctions with a high speed or a high voltage resolution and hence with characteristic voltages spanning over several orders of magnitude. We present here our recent results on Nb/Al/Nb junctions where, by changing some fabrication parameters such as the thickness and deposition rate of the Al barrier, it is possible to obtain junctions with very different electrical properties. These junctions have characteristic voltages varying from a few tens of μV up to more than 1 mV, with critical current densities from 103 up to 106 A/cm2.
Keywords :
Josephson effect; aluminium; critical current density (superconductivity); niobium; superconductor-normal-superconductor devices; Josephson device; Nb-Al-Nb; Nb/Al/Nb junction; RSFQ logic circuit; SNS technology; characteristic voltage; critical current density; electrical properties; fabrication process; nonhysteretic junction; programmable voltage standard; superconducting electronics; Critical current density; Electrodes; Fabrication; Josephson junctions; Niobium; Superconducting devices; Superconducting epitaxial layers; Superconducting films; Superconducting logic circuits; Voltage;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/TASC.2003.813667
Filename :
1211563
Link To Document :
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