• DocumentCode
    1236229
  • Title

    Radar characterization of ship wake signatures and ambient ocean clutter features

  • Author

    Schurmann, Stuart R.

  • Author_Institution
    XonTech Inc., Van Nuys, CA, USA
  • Volume
    4
  • Issue
    8
  • fYear
    1989
  • Firstpage
    3
  • Lastpage
    8
  • Abstract
    Characteristics of ship wakes and ambient ocean features in synthetic-aperture radar (SAR) and coherent real-aperture radar (RAR) images are studied, and two algorithms are evaluated to assess the value of using wakes for detecting and classifying ships. Empirical models of SAR ship-wake signatures, derived from measurements of wakes in L-band SAR images from SIR-B, are incorporated in the detection algorithms. To further study wake and ambient characteristics, data from a land-based X-band coherent RAR (which overlooks the ocean) are processed to obtain ocean surface Doppler velocities as a function of range and time. Line-of-sight orbital currents of ocean waves are easily detected, and the power in the velocity-field spectrum is concentrated on the dispersion curve for free-surface gravity waves. Cuts taken along this curve produce quantitative wave spectra for the study of ocean surface features and ship-induced wake modifications of the surface.<>
  • Keywords
    Doppler effect; microwave imaging; ocean waves; oceanographic techniques; radar applications; remote sensing; ships; L-band SAR images; SAR; SIR-B; algorithms; ambient ocean clutter features; coherent real-aperture radar; dispersion curve; free-surface gravity waves; land-based X-band coherent RAR; line of sight orbital currents; microwave imaging; ocean surface Doppler velocities; quantitative wave spectra; ship wake signatures; synthetic-aperture radar; wakes; Detection algorithms; Extraterrestrial measurements; Marine vehicles; Oceans; Radar detection; Radar imaging; Sea measurements; Sea surface; Surface waves; Synthetic aperture radar;
  • fLanguage
    English
  • Journal_Title
    Aerospace and Electronic Systems Magazine, IEEE
  • Publisher
    ieee
  • ISSN
    0885-8985
  • Type

    jour

  • DOI
    10.1109/62.35655
  • Filename
    35655