Title :
Automatic generation of binary feature detectors
Author :
Tamburino, Louis A. ; Rizki, Mateen M.
Author_Institution :
Wright-Patterson AFB, OH, USA
Abstract :
The authors discuss the automatic generation of feature detectors, which is the major task in the design of classical pattern recognition systems. They present a software environment that, in place of human intuition, utilizes learning strategies and stochastic search procedures to guide the generation process. The environment allows the exploration of evolutionary learning processes and adaptive control mechanisms. A preliminary experiment with a two-class recognition system is described, and initial observations are discussed. The recognition task requires the classification of upper case English letters into two categories: target and nontarget.<>
Keywords :
character recognition; computerised pattern recognition; learning systems; programming environments; search problems; adaptive control mechanisms; automatic generation; binary feature detectors; computerised pattern recognition; evolutionary learning processes; learning strategies; nontarget; pattern recognition systems; software environment; stochastic search procedures; target; two-class recognition system; upper case English letters; Character recognition; Closed loop systems; Computer vision; Data mining; Detectors; Humans; Image edge detection; Image recognition; Stochastic processes; Target recognition;
Journal_Title :
Aerospace and Electronic Systems Magazine, IEEE