• DocumentCode
    1236400
  • Title

    Maximum heat-sink temperature for CW operation of a double-heterostructure semiconductor injection laser

  • Author

    Hsieh, H.C.

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Eng., Iowa State Univ., Ames, IA, USA
  • Volume
    25
  • Issue
    10
  • fYear
    1989
  • fDate
    10/1/1989 12:00:00 AM
  • Firstpage
    2079
  • Lastpage
    2083
  • Abstract
    Assuming that the temperature dependence of the threshold current for pulsed operation is known, an analytical expression for the maximum heat-sink temperature, Thm, for CW operation of the laser can be derived. The maximum heat-sink temperature is expressed in terms of the characteristic temperature T0, the room-temperature threshold current for pulsed operation I0 , the equivalent effective thermal resistance θ, and the equivalent effective series electrical resistance r of the device. It is shown that the values of Thm can be enhanced by increasing the value of T0 or by decreasing the values of I0, θ, and r
  • Keywords
    electric current; electric resistance; heat sinks; semiconductor junction lasers; temperature distribution; thermal resistance; CW operation; characteristic temperature; double-heterostructure semiconductor injection laser; effective series electrical resistance; effective thermal resistance; heat-sink temperature; heat-sink temperature value enhanced; maximum heat-sink temperature; pulsed operation; room-temperature threshold current; temperature dependence; threshold current; DH-HEMTs; Gallium arsenide; Indium phosphide; Optical pumping; Resistance heating; Semiconductor lasers; Temperature dependence; Temperature sensors; Thermal resistance; Threshold current;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/3.35718
  • Filename
    35718