DocumentCode
1236400
Title
Maximum heat-sink temperature for CW operation of a double-heterostructure semiconductor injection laser
Author
Hsieh, H.C.
Author_Institution
Dept. of Electr. Eng. & Comput. Eng., Iowa State Univ., Ames, IA, USA
Volume
25
Issue
10
fYear
1989
fDate
10/1/1989 12:00:00 AM
Firstpage
2079
Lastpage
2083
Abstract
Assuming that the temperature dependence of the threshold current for pulsed operation is known, an analytical expression for the maximum heat-sink temperature, T hm, for CW operation of the laser can be derived. The maximum heat-sink temperature is expressed in terms of the characteristic temperature T 0, the room-temperature threshold current for pulsed operation I 0 , the equivalent effective thermal resistance θ, and the equivalent effective series electrical resistance r of the device. It is shown that the values of T hm can be enhanced by increasing the value of T 0 or by decreasing the values of I 0, θ, and r
Keywords
electric current; electric resistance; heat sinks; semiconductor junction lasers; temperature distribution; thermal resistance; CW operation; characteristic temperature; double-heterostructure semiconductor injection laser; effective series electrical resistance; effective thermal resistance; heat-sink temperature; heat-sink temperature value enhanced; maximum heat-sink temperature; pulsed operation; room-temperature threshold current; temperature dependence; threshold current; DH-HEMTs; Gallium arsenide; Indium phosphide; Optical pumping; Resistance heating; Semiconductor lasers; Temperature dependence; Temperature sensors; Thermal resistance; Threshold current;
fLanguage
English
Journal_Title
Quantum Electronics, IEEE Journal of
Publisher
ieee
ISSN
0018-9197
Type
jour
DOI
10.1109/3.35718
Filename
35718
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