DocumentCode :
1236445
Title :
Power spectrum measurement of a modulated semiconductor laser using an interferometric self-homodyne technique: influence of quantum phase noise and field correlation
Author :
Baney, Douglas M. ; Gallion, Philippe B.
Author_Institution :
Ecole Nat. Superieure des Telecommun., Paris, France
Volume :
25
Issue :
10
fYear :
1989
fDate :
10/1/1989 12:00:00 AM
Firstpage :
2106
Lastpage :
2112
Abstract :
The amplitude-phase coupling effect introduces important dynamic line broadening in modulated semiconductor laser systems. The theory of a technique allowing measurement of the broadened spectrum using a single laser is presented. The quantum phase fluctuations of the lasing field are shown to be of great importance to the photocurrent spectrum of the mixed fields. Expressions for the photocurrent spectrum, which is shown to measure the optical field modulation power spectrum, are derived. Measurement results illustrating the theory are also presented
Keywords :
electron device noise; laser variables measurement; light interferometry; optical modulation; optical noise measurement; quantum optics; semiconductor junction lasers; spectral line breadth; amplitude-phase coupling effect; broadened spectrum measurement technique theory; dynamic line broadening; field correlation; interferometric self-homodyne technique; lasing field; modulated semiconductor laser; optical field modulation power spectrum; photocurrent spectrum; power spectrum measurement; quantum phase fluctuations; quantum phase noise; Amplitude modulation; Chirp modulation; Frequency modulation; Frequency shift keying; Laser noise; Laser theory; Power lasers; Power measurement; Semiconductor lasers; Wavelength measurement;
fLanguage :
English
Journal_Title :
Quantum Electronics, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9197
Type :
jour
DOI :
10.1109/3.35722
Filename :
35722
Link To Document :
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