DocumentCode
1236445
Title
Power spectrum measurement of a modulated semiconductor laser using an interferometric self-homodyne technique: influence of quantum phase noise and field correlation
Author
Baney, Douglas M. ; Gallion, Philippe B.
Author_Institution
Ecole Nat. Superieure des Telecommun., Paris, France
Volume
25
Issue
10
fYear
1989
fDate
10/1/1989 12:00:00 AM
Firstpage
2106
Lastpage
2112
Abstract
The amplitude-phase coupling effect introduces important dynamic line broadening in modulated semiconductor laser systems. The theory of a technique allowing measurement of the broadened spectrum using a single laser is presented. The quantum phase fluctuations of the lasing field are shown to be of great importance to the photocurrent spectrum of the mixed fields. Expressions for the photocurrent spectrum, which is shown to measure the optical field modulation power spectrum, are derived. Measurement results illustrating the theory are also presented
Keywords
electron device noise; laser variables measurement; light interferometry; optical modulation; optical noise measurement; quantum optics; semiconductor junction lasers; spectral line breadth; amplitude-phase coupling effect; broadened spectrum measurement technique theory; dynamic line broadening; field correlation; interferometric self-homodyne technique; lasing field; modulated semiconductor laser; optical field modulation power spectrum; photocurrent spectrum; power spectrum measurement; quantum phase fluctuations; quantum phase noise; Amplitude modulation; Chirp modulation; Frequency modulation; Frequency shift keying; Laser noise; Laser theory; Power lasers; Power measurement; Semiconductor lasers; Wavelength measurement;
fLanguage
English
Journal_Title
Quantum Electronics, IEEE Journal of
Publisher
ieee
ISSN
0018-9197
Type
jour
DOI
10.1109/3.35722
Filename
35722
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