• DocumentCode
    1236445
  • Title

    Power spectrum measurement of a modulated semiconductor laser using an interferometric self-homodyne technique: influence of quantum phase noise and field correlation

  • Author

    Baney, Douglas M. ; Gallion, Philippe B.

  • Author_Institution
    Ecole Nat. Superieure des Telecommun., Paris, France
  • Volume
    25
  • Issue
    10
  • fYear
    1989
  • fDate
    10/1/1989 12:00:00 AM
  • Firstpage
    2106
  • Lastpage
    2112
  • Abstract
    The amplitude-phase coupling effect introduces important dynamic line broadening in modulated semiconductor laser systems. The theory of a technique allowing measurement of the broadened spectrum using a single laser is presented. The quantum phase fluctuations of the lasing field are shown to be of great importance to the photocurrent spectrum of the mixed fields. Expressions for the photocurrent spectrum, which is shown to measure the optical field modulation power spectrum, are derived. Measurement results illustrating the theory are also presented
  • Keywords
    electron device noise; laser variables measurement; light interferometry; optical modulation; optical noise measurement; quantum optics; semiconductor junction lasers; spectral line breadth; amplitude-phase coupling effect; broadened spectrum measurement technique theory; dynamic line broadening; field correlation; interferometric self-homodyne technique; lasing field; modulated semiconductor laser; optical field modulation power spectrum; photocurrent spectrum; power spectrum measurement; quantum phase fluctuations; quantum phase noise; Amplitude modulation; Chirp modulation; Frequency modulation; Frequency shift keying; Laser noise; Laser theory; Power lasers; Power measurement; Semiconductor lasers; Wavelength measurement;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/3.35722
  • Filename
    35722