• DocumentCode
    1236590
  • Title

    Propagation constant determination in microwave fixture de-embedding procedure

  • Author

    Mondal, Jyoti P. ; Chen, Tzu-Hung

  • Author_Institution
    Gen. Electr. Co., Syracuse, NY, USA
  • Volume
    36
  • Issue
    4
  • fYear
    1988
  • fDate
    4/1/1988 12:00:00 AM
  • Firstpage
    706
  • Lastpage
    714
  • Abstract
    An improper choice of dimensions for the standards used in the microwave de-embedding procedure will cause errors in the determination of the propagation constant. This leads to unrealistic values for the attenuation constant, which in turn causes errors in the de-embedded results. Proper selection of dimensions is made to minimize such errors. Physically realistic values are obtained with this selection
  • Keywords
    S-parameters; measurement errors; measurement standards; measurement theory; microwave measurement; semiconductor device testing; S-parameter measurement; attenuation constant; errors; microwave deembedding procedure; microwave fixture de-embedding; propagation constant; semiconductor device testing; standards; Attenuation; Fixtures; Impedance; Laboratories; Measurement standards; Microstrip; Microwave devices; Propagation constant; Scattering parameters; Testing;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.3575
  • Filename
    3575