Analysis of dielectric-loaded cavities for characterization of the nonlinear properties of high temperature superconductors

Author

Mateu, J. ; Collado, C. ; Menéndez, O. ; O´Callaghan, J.M.

Author_Institution

Centre Tecnologic de Telecomunicacions de Catalunya, Barcelona, Spain

Volume

13

Issue

2

fYear

2003

fDate

6/1/2003 12:00:00 AM

Firstpage

332

Lastpage

335

Abstract

This work describes and compares two alternative methods of analyzing dielectric-loaded cavities for measurement of intermodulation distortion in HTS films. One of them is based on assuming a specific type of HTS nonlinearities and developing theoretical equations based on them. The second is based on a numerical approach that can be applied to many types of nonlinearities. Both methods are shown to work on measured data of representative HTS films.

Keywords

high-temperature superconductors; intermodulation distortion; superconducting cavity resonators; superconducting microwave devices; superconducting thin films; HTS films; cavity resonator; dielectric-loaded cavities; high temperature superconductors; intermodulation distortion; microwave nonlinearities; nonlinear properties; Current density; Dielectric measurements; Distortion measurement; Electrical resistance measurement; High temperature superconductors; Intermodulation distortion; Nonlinear equations; Superconducting films; Superconducting materials; Surface resistance;

fLanguage

English

Journal_Title

Applied Superconductivity, IEEE Transactions on

Publisher

ieee

ISSN

1051-8223

Type

jour

DOI

10.1109/TASC.2003.813725

Filename

1211609