DocumentCode :
1237079
Title :
Cell based design methodology for BDD SFQ logic circuits: a high speed test and feasibility for large scale circuit applications
Author :
Yoshikawa, N. ; Yoda, K. ; Hoshina, H. ; Kawasaki, K. ; Fujiwara, K. ; Matsuzaki, F. ; Nakajima, N.
Author_Institution :
Dept. of the Electr. & Comput. Eng., Yokohama Nat. Univ., Japan
Volume :
13
Issue :
2
fYear :
2003
fDate :
6/1/2003 12:00:00 AM
Firstpage :
523
Lastpage :
526
Abstract :
We have proposed a cell-based design methodology for SFQ logic circuits based on a binary decision diagram (BDD) and implemented a BDD SFQ standard cell library using a Hypres Nb process. In this design methodology, any logic function can be implemented by connecting binary switches. Since the circuits are dual rail logic and do not need a global clock, difficulty in the timing design is reduced considerably. In our cell-based design approach, the cell library is composed of only five kinds of basic cells, whose circuit parameters are optimized so as to remove the inter-cell interaction. At the layout level, the cells have the identical size so that circuits can be implemented by simply embedding the basic cells. In this study we have performed an on-chip high-speed test of the BDD SFQ logic circuits. The test system consists of two four-bit data-driven self-timed (DDST) shift registers with a ladder type clock generator. We have confirmed 12 GHz operations of the BDD SFQ logic circuit. We have also examined circuit size dependence of the DC bias margin of large BDD SFQ circuits.
Keywords :
binary decision diagrams; circuit CAD; integrated circuit design; integrated circuit testing; logic CAD; logic testing; niobium compounds; shift registers; superconducting device testing; superconducting logic circuits; timing; 12 GHz; BDD SFQ standard cell library; DC bias margin; Hypres Nb process; Nb; SFQ logic circuits; binary decision diagram; binary switches; cell-based design methodology; circuit size dependence; data-driven self-timed shift registers; dual rail logic; ladder type clock generator; large BDD SFQ circuits; large scale circuit applications; logic function; on-chip high speed test; timing design; Binary decision diagrams; Boolean functions; Circuit testing; Clocks; Data structures; Design methodology; Large-scale systems; Libraries; Logic circuits; Logic testing;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/TASC.2003.813923
Filename :
1211655
Link To Document :
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