DocumentCode :
1237143
Title :
Design and component test of SFQ shift register memories
Author :
Fujiwara, K. ; Hoshina, H. ; Yamashiro, Y. ; Yoshikawa, N.
Author_Institution :
Dept. of Electr., Yokohama Nat. Univ., Japan
Volume :
13
Issue :
2
fYear :
2003
fDate :
6/1/2003 12:00:00 AM
Firstpage :
555
Lastpage :
558
Abstract :
The lack of a high-density and high-speed memory is a serious impediment for realization of large-scale RSFQ digital systems. A shift resister memory, which has high throughput and simple circuit structure, is one candidate to overcome this drawback. We show a design framework of the shift register memory, which is usable for the high-speed register files and the main memories of the RSFQ microprocessor. The proposed system consists of an array of shift registers and a packet decoder that switches a high-speed serial data stream into the specified shift register. The target clock frequency is 16 GHz assuming 2.5 kA/cm2 Nb standard process. We have estimated the propagation delay and the circuit area of the data-driven self-timed (DDST) packet decoder. Based on this estimation, we have also evaluated the access time and the area of the memory system. Several key components, including the one-to-two packet switch and the one-to-four DDST packet decoder, were implemented and their correct operations were confirmed.
Keywords :
decoding; high-speed integrated circuits; integrated circuit design; integrated circuit testing; logic testing; niobium; shift registers; superconducting device testing; superconducting memory circuits; 16 GHz; Nb standard process; RSFQ digital systems; RSFQ microprocessor; SFQ shift register memories; access time; component test; data-driven self-timed decoder; design framework; high throughput; high-speed memory; high-speed register files; high-speed serial data stream; main memories; memory system area; packet decoder; propagation delay; Circuit testing; Decoding; Digital systems; Impedance; Large-scale systems; Microprocessors; Packet switching; Shift registers; Switches; Throughput;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/TASC.2003.813945
Filename :
1211663
Link To Document :
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