DocumentCode
1237181
Title
NbN and Nb SFQ device performance
Author
Johnson, Mark W. ; Dalrymple, Bruce J. ; Durand, Dale J. ; Luine, Jerome A.
Author_Institution
Space & Electron., TRW Inc., Redondo Beach, CA, USA
Volume
13
Issue
2
fYear
2003
fDate
6/1/2003 12:00:00 AM
Firstpage
571
Lastpage
574
Abstract
The static frequency divider is commonly used as a performance benchmark for both superconductor and semiconductor digital device technologies. We present results of a static divide-by-two circuit, an NbN (1 kA/cm2) SFQ T-flip-flop (TFF) operating to 97 GHz. Details of the measurement and operating criterion are discussed. Measurements of junction capacitance, a particularly important factor effecting device performance, are presented for TRW´s NbN process. Simulations of expected device performance are shown to explain measured performance reasonably well. NbN results are presented alongside a those of a recent 8kA/cm2 Nb divider operating at 300 GHz, as well as published Nb TFF results.
Keywords
SQUIDs; capacitance; flip-flops; frequency dividers; superconducting logic circuits; 300 GHz; 97 GHz; Nb; NbN; SFQ device performance; T-flip-flop; TFF; junction capacitance; static frequency divider; superconductor digital device technologies; Capacitance measurement; Circuit testing; Cutoff frequency; Damping; Frequency conversion; Josephson junctions; Niobium; Particle measurements; Plasma measurements; SQUIDs;
fLanguage
English
Journal_Title
Applied Superconductivity, IEEE Transactions on
Publisher
ieee
ISSN
1051-8223
Type
jour
DOI
10.1109/TASC.2003.813949
Filename
1211667
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