• DocumentCode
    1237181
  • Title

    NbN and Nb SFQ device performance

  • Author

    Johnson, Mark W. ; Dalrymple, Bruce J. ; Durand, Dale J. ; Luine, Jerome A.

  • Author_Institution
    Space & Electron., TRW Inc., Redondo Beach, CA, USA
  • Volume
    13
  • Issue
    2
  • fYear
    2003
  • fDate
    6/1/2003 12:00:00 AM
  • Firstpage
    571
  • Lastpage
    574
  • Abstract
    The static frequency divider is commonly used as a performance benchmark for both superconductor and semiconductor digital device technologies. We present results of a static divide-by-two circuit, an NbN (1 kA/cm2) SFQ T-flip-flop (TFF) operating to 97 GHz. Details of the measurement and operating criterion are discussed. Measurements of junction capacitance, a particularly important factor effecting device performance, are presented for TRW´s NbN process. Simulations of expected device performance are shown to explain measured performance reasonably well. NbN results are presented alongside a those of a recent 8kA/cm2 Nb divider operating at 300 GHz, as well as published Nb TFF results.
  • Keywords
    SQUIDs; capacitance; flip-flops; frequency dividers; superconducting logic circuits; 300 GHz; 97 GHz; Nb; NbN; SFQ device performance; T-flip-flop; TFF; junction capacitance; static frequency divider; superconductor digital device technologies; Capacitance measurement; Circuit testing; Cutoff frequency; Damping; Frequency conversion; Josephson junctions; Niobium; Particle measurements; Plasma measurements; SQUIDs;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/TASC.2003.813949
  • Filename
    1211667