DocumentCode :
1237296
Title :
Quantum Boolean Circuits are 1-Testable
Author :
Chou, Yao-Hsin ; Tsai, I-Ming ; Kuo, Sy-Yen
Author_Institution :
Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei
Volume :
7
Issue :
4
fYear :
2008
fDate :
7/1/2008 12:00:00 AM
Firstpage :
484
Lastpage :
492
Abstract :
Recently, a systematic procedure was proposed to derive a minimum input quantum circuit for any given classical logic with the generalized quantum Toffoli gate, which is universal in Boolean logic. Since quantum Boolean circuits are reversible, we can apply this property to build quantum iterative logic array (QILA). QILA can be easily tested in constant time (C-testable) if stuck-at fault model is assumed. In this paper, we use Hadamard and general controlled-controlled not gates to make QILA 1-testable. That is, for any quantum Boolean circuit, the number of test patterns is independent of both the size of the array and the length of the inputs.
Keywords :
Boolean algebra; iterative methods; quantum gates; Boolean logic; NOT gates; generalized quantum Toffoli gate; logic circuit; minimum input quantum circuit; quantum iterative logic array; stuck-at fault model; C-testable; Iterative logic array (ILA); M-testable; design for testability (DFT); iterative logic array (ILA); quantum circuit; quantum computation; reversible circuit;
fLanguage :
English
Journal_Title :
Nanotechnology, IEEE Transactions on
Publisher :
ieee
ISSN :
1536-125X
Type :
jour
DOI :
10.1109/TNANO.2008.926369
Filename :
4531956
Link To Document :
بازگشت