DocumentCode :
1237303
Title :
Dual Supply Voltages and Dual Clock Frequencies for Lower Clock Power and Suppressed Temperature-Gradient-Induced Clock Skew
Author :
Tawfik, Sherif A. ; Kursun, Volkan
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Wisconsin-Madison, Madison, WI, USA
Volume :
18
Issue :
3
fYear :
2010
fDate :
3/1/2010 12:00:00 AM
Firstpage :
347
Lastpage :
355
Abstract :
Two new clocking methodologies based on supply voltage and frequency scaling are proposed in this paper for lowering the power consumption and the temperature-fluctuation-induced skew without degrading the clock frequency. The clock signal is distributed globally at a scaled supply voltage with a single clock frequency with the first clocking methodology. Alternatively, dual supply voltages and dual signal frequencies are employed with the second methodology that provides enhanced power savings. The optimum supply voltage that minimizes clock skew is 44% lower than the nominal supply voltage in a 0.18 ??m TSMC CMOS technology. Novel multi-threshold voltage level converters and frequency multipliers are employed at the leaves of the clock trees in order to maintain the synchronous system performance. The temperature-fluctuation-induced skew and the power consumption are reduced by up to 80% and 76%, respectively, with the proposed dual supply voltage and dual frequency clock distribution networks as compared to a standard clock tree operating at the nominal supply voltage with a single clock frequency.
Keywords :
CMOS digital integrated circuits; clocks; convertors; frequency multipliers; power aware computing; TSMC CMOS technology; clock signal; dual frequency clock distribution networks; dual supply voltages; enhanced power savings; frequency multipliers; frequency scaling; multithreshold voltage level converters; power consumption; size 0.18 mum; suppressed temperature-gradient-induced clock skew; synchronous system performance; Clock skew; dual-${V}_{rm DD}$; dual-${V}_{rm th}$; frequency scaling; supply voltage scaling; temperature variations;
fLanguage :
English
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
1063-8210
Type :
jour
DOI :
10.1109/TVLSI.2008.2010549
Filename :
4814498
Link To Document :
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