DocumentCode
1237540
Title
Room-temperature self-annealing of heavy-ion-irradiated InGaAs/GaAs quantum wells
Author
Dhaka, V.D.S. ; Tkachenko, N.V. ; Lemmetyinen, H. ; Pavelescu, E.-M. ; Konttinen, J. ; Pessa, M. ; Arstila, K. ; Keinonen, J.
Author_Institution
Inst. of Mater. Chem., Tampere Univ. of Technol., Finland
Volume
41
Issue
23
fYear
2005
Firstpage
1304
Lastpage
1305
Abstract
The long-term stability of defects with the ageing of heavy-ion-irradiated and post-irradiated-annealed InGaAs/GaAs compound semiconductor quantum wells is reported using the time-resolved upconversion technique of luminescence lifetimes. The defects created by Ni+-heavy-ion irradiation are found to be thermally unstable. The ageing tests prove that a substantial amount of defects are removed by self-annealing in about a month of time even at room temperature through a slow diffusion process, resulting in a dynamically stable sample but with a twofold increment in lifetimes. If the sample is annealed upon Ni+ irradiation, the defects are removed immediately, yielding stable and much longer relaxation times independent of the ageing process. These results may be useful in designing devices with an active region as ion-irradiated semiconductor quantum wells.
Keywords
III-V semiconductors; ageing; diffusion; gallium arsenide; indium compounds; radiation effects; rapid thermal annealing; semiconductor quantum wells; InGaAs-GaAs; InGaAs/GaAs quantum wells; ageing test; diffusion process; heavy-ion-irradiation; self-annealing; semiconductor quantum wells; time-resolved upconversion technique;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:20053117
Filename
1541787
Link To Document