DocumentCode
1237557
Title
Determination of overwrite specification in thin-film head/disk systems
Author
Bhattacharyya, Manoj K. ; Gill, H.S. ; Simmons, Ralph F., Jr.
Author_Institution
Hewlett-Packard Co., Palo Alto, CA, USA
Volume
25
Issue
6
fYear
1989
fDate
11/1/1989 12:00:00 AM
Firstpage
4479
Lastpage
4489
Abstract
A self-consistent write analysis using the Preisach model is presented and used to calculate overwrite in thin-film head/disk systems. Two overwrite characterization procedures are discussed, and for each of the procedures the calculated values are compared with measurements. Through a correlation of overwrite, nonlinear peak shifts, and readback output voltage the authors determine the overwrite requirement. They show that whereas -30 dB of overwrite will ensure a satisfactory overall performance of the recording system, a much lower overwrite, say -20 dB, can work in certain situations. An analytical implementation of the self-consistent model is presented and verified with measurements. The analytical approach can be used to determine the overwrite at any applied field for any head/disk combination. The authors introduce a normalized effective field h n, which depends on M rδ, H c, and other head/disk parameters. It is shown that a value of h n greater than 0.8 is needed for overwrite values of better than 25 dB. The importance of various head/disk parameters in optimizing the overwrite is also discussed
Keywords
magnetic disc storage; magnetic heads; magnetic recording; magnetic thin film devices; Preisach model; analytical approach; nonlinear peak shifts; normalized effective field; overwrite characterization procedures; readback output voltage; recording system; self-consistent model; self-consistent write analysis; thin-film head/disk systems; Magnetic analysis; Magnetic anisotropy; Magnetic heads; Magnetic hysteresis; Magnetic materials; Magnetostatics; Micromagnetics; Perpendicular magnetic anisotropy; Transistors; Voltage;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/20.45329
Filename
45329
Link To Document