DocumentCode :
1237728
Title :
Effective silicon debug is key for time to money
Author :
Cheng, Tim
Volume :
25
Issue :
3
fYear :
2008
Firstpage :
204
Lastpage :
204
Abstract :
Effective silicon debug is key for time to money. Silicon debug and diagnosis attempt to locate and fix the root causes of failures upon identification of a chip that violates either a functional or timing specification. However, the tasks of silicon debug and diagnosis are becoming increasingly more challenging, and their costs continue to rise for complex SoCs. This issue of IEEE Design & Test features a special issue on silicon debug and diagnosis. This issue also includes a roundtable on thousand-core chips.
Keywords :
Computer bugs; Costs; Debugging; Design automation; Design engineering; Emulation; Failure analysis; Silicon; Testing; Timing; debug; diagnosis; presilicon verification; silicon; thousand-core chips;
fLanguage :
English
Journal_Title :
Design & Test of Computers, IEEE
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.2008.64
Filename :
4534156
Link To Document :
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