DocumentCode
1237728
Title
Effective silicon debug is key for time to money
Author
Cheng, Tim
Volume
25
Issue
3
fYear
2008
Firstpage
204
Lastpage
204
Abstract
Effective silicon debug is key for time to money. Silicon debug and diagnosis attempt to locate and fix the root causes of failures upon identification of a chip that violates either a functional or timing specification. However, the tasks of silicon debug and diagnosis are becoming increasingly more challenging, and their costs continue to rise for complex SoCs. This issue of IEEE Design & Test features a special issue on silicon debug and diagnosis. This issue also includes a roundtable on thousand-core chips.
Keywords
Computer bugs; Costs; Debugging; Design automation; Design engineering; Emulation; Failure analysis; Silicon; Testing; Timing; debug; diagnosis; presilicon verification; silicon; thousand-core chips;
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/MDT.2008.64
Filename
4534156
Link To Document