• DocumentCode
    1237728
  • Title

    Effective silicon debug is key for time to money

  • Author

    Cheng, Tim

  • Volume
    25
  • Issue
    3
  • fYear
    2008
  • Firstpage
    204
  • Lastpage
    204
  • Abstract
    Effective silicon debug is key for time to money. Silicon debug and diagnosis attempt to locate and fix the root causes of failures upon identification of a chip that violates either a functional or timing specification. However, the tasks of silicon debug and diagnosis are becoming increasingly more challenging, and their costs continue to rise for complex SoCs. This issue of IEEE Design & Test features a special issue on silicon debug and diagnosis. This issue also includes a roundtable on thousand-core chips.
  • Keywords
    Computer bugs; Costs; Debugging; Design automation; Design engineering; Emulation; Failure analysis; Silicon; Testing; Timing; debug; diagnosis; presilicon verification; silicon; thousand-core chips;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.2008.64
  • Filename
    4534156