DocumentCode :
1237750
Title :
Functional Debug Techniques for Embedded Systems
Author :
Vermeulen, Bart
Author_Institution :
NXP Semicond., Eindhoven
Volume :
25
Issue :
3
fYear :
2008
Firstpage :
208
Lastpage :
215
Abstract :
Some problems in a new chip design or its embedded software show up only when a silicon prototype of the chip is placed in its intended target environment and the embedded software is executed. Traditionally, embedded-system debug is very difficult and time-consuming because of the intrinsic lack of internal system observability in the target environment. Design for debug (DFD) is the act of adding debug support to a chip´s design in the realization that not every silicon chip or embedded-software application is right the first time. In the past few years, functional debug has made significant progress. This article describes the most common structured approaches available for silicon debug of embedded systems.
Keywords :
embedded systems; logic CAD; logic testing; microprocessor chips; system-on-chip; SoC; chip design; embedded system; functional debug technique; silicon prototype; Costs; Design for disassembly; Embedded software; Embedded system; Observability; Pins; Silicon; Software prototyping; Switches; Time to market; debug use cases; functional debugging; silicon debug; silicon validation;
fLanguage :
English
Journal_Title :
Design & Test of Computers, IEEE
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.2008.66
Filename :
4534159
Link To Document :
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