• DocumentCode
    1237750
  • Title

    Functional Debug Techniques for Embedded Systems

  • Author

    Vermeulen, Bart

  • Author_Institution
    NXP Semicond., Eindhoven
  • Volume
    25
  • Issue
    3
  • fYear
    2008
  • Firstpage
    208
  • Lastpage
    215
  • Abstract
    Some problems in a new chip design or its embedded software show up only when a silicon prototype of the chip is placed in its intended target environment and the embedded software is executed. Traditionally, embedded-system debug is very difficult and time-consuming because of the intrinsic lack of internal system observability in the target environment. Design for debug (DFD) is the act of adding debug support to a chip´s design in the realization that not every silicon chip or embedded-software application is right the first time. In the past few years, functional debug has made significant progress. This article describes the most common structured approaches available for silicon debug of embedded systems.
  • Keywords
    embedded systems; logic CAD; logic testing; microprocessor chips; system-on-chip; SoC; chip design; embedded system; functional debug technique; silicon prototype; Costs; Design for disassembly; Embedded software; Embedded system; Observability; Pins; Silicon; Software prototyping; Switches; Time to market; debug use cases; functional debugging; silicon debug; silicon validation;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.2008.66
  • Filename
    4534159