DocumentCode
1237808
Title
Overview of Debug Standardization Activities
Author
Vermeulen, Bart ; Stollon, Neal ; Kühnis, Rolf ; Swoboda, Gary ; Rearick, Jeff
Author_Institution
NXP Semicond., Eindhoven
Volume
25
Issue
3
fYear
2008
Firstpage
258
Lastpage
267
Abstract
The semiconductor industry is disaggregated, with a complex web of suppliers and consumers. Standards help to facilitate and simplify the debug process. This article provides an overview of current standardization activity. One area in need of such standardization is that of on-chip debug processes and instruments. The debug area particularly exhibits limited commonality between different IP providers in terms of interfaces and methods for complex SoCs. The problem becomes even greater with more SoC integrators using diverse IP from different vendors, requiring an increasing range of debug, analysis, and optimization capabilities. This article describes the goals and ongoing activities of five debug standardization bodies: the Nexus 5001, MIPI (Mobile Industry Processor Interface) Test and Debug, IEEE PI149.7, IEEE P1687, and OCP-IP (Open Core Protocol International Partnership) Debug working groups.
Keywords
IEEE standards; circuit optimisation; computer debugging; logic testing; standardisation; system-on-chip; IEEE P1687; IEEE PI149.7; MIPI Test and Debug; Mobile Industry Processor Interface; Nexus 5001; OCP-IP; Open Core Protocol International Partnership; SoC; circuit optimization; debug standardization; semiconductor industry; system-on-chip; Electronics industry; Embedded software; Embedded system; Hardware; Instruments; Network-on-a-chip; Software debugging; Standardization; System testing; System-on-a-chip; debug interfaces; debug standardization; debugger tools; performance analysis; silicon debug; software debug;
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/MDT.2008.81
Filename
4534167
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