• DocumentCode
    1237808
  • Title

    Overview of Debug Standardization Activities

  • Author

    Vermeulen, Bart ; Stollon, Neal ; Kühnis, Rolf ; Swoboda, Gary ; Rearick, Jeff

  • Author_Institution
    NXP Semicond., Eindhoven
  • Volume
    25
  • Issue
    3
  • fYear
    2008
  • Firstpage
    258
  • Lastpage
    267
  • Abstract
    The semiconductor industry is disaggregated, with a complex web of suppliers and consumers. Standards help to facilitate and simplify the debug process. This article provides an overview of current standardization activity. One area in need of such standardization is that of on-chip debug processes and instruments. The debug area particularly exhibits limited commonality between different IP providers in terms of interfaces and methods for complex SoCs. The problem becomes even greater with more SoC integrators using diverse IP from different vendors, requiring an increasing range of debug, analysis, and optimization capabilities. This article describes the goals and ongoing activities of five debug standardization bodies: the Nexus 5001, MIPI (Mobile Industry Processor Interface) Test and Debug, IEEE PI149.7, IEEE P1687, and OCP-IP (Open Core Protocol International Partnership) Debug working groups.
  • Keywords
    IEEE standards; circuit optimisation; computer debugging; logic testing; standardisation; system-on-chip; IEEE P1687; IEEE PI149.7; MIPI Test and Debug; Mobile Industry Processor Interface; Nexus 5001; OCP-IP; Open Core Protocol International Partnership; SoC; circuit optimization; debug standardization; semiconductor industry; system-on-chip; Electronics industry; Embedded software; Embedded system; Hardware; Instruments; Network-on-a-chip; Software debugging; Standardization; System testing; System-on-a-chip; debug interfaces; debug standardization; debugger tools; performance analysis; silicon debug; software debug;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.2008.81
  • Filename
    4534167